JAN AMARU PALOMINO TOFFLINGER

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Artículos en memoria o anales de congreso (5)Artículos en revista (57)Tesis (1)

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Se encontraron 63 publicaciones

FLORES, L. F.; TUCTO, K. Y.; GUERRA, J. A.; PALOMINO TOFFLINGER, J.; SERQUEN, E. S.; Osvet, A.; Batentschuk, M.; Winnacker, A.; GRIESELER, R.; Weingärtner, R.(2019). Luminescence properties of Yb3+-Tb3+ co-doped amorphous silicon oxycarbide thin films. Optical materials. Volumen: 92. (pp. 16 - 21). Recuperado de: https://www.sciencedirect.com/science/article/pii/S0925346719302320

TUCTO, K. Y.; APONTE, W.; DULANTO, J. A.; PALOMINO TOFFLINGER, J.; GUERRA, J. A.; GRIESELER, R.(2019). Combinatorial approach toward optimization of the light emission intensity of AlOxNy:Yb3+ thin films. Applied optics. Volumen: 58. (pp. 3097 - 3103). Recuperado de: https://www.osapublishing.org/ao/abstract.cfm?uri=ao-58-12-3097

TEJADA, A.; Braunger, S.; Kegelmann, L.; Albrecht, S.; PALOMINO TOFFLINGER, J.; Korte, L.; GUERRA, J. A.(2018). Determination of the complex refractive index, optical bandgap and Urbach energy of CH3NH3PbI3 and FA1-yCsyPb(I-xBrx)3 perovskite thin films. En Latin America Optics and Photonics . OSA Publishing. Recuperado de: https://www.osapublishing.org/abstract.cfm?uri=LAOP-2018-Tu4A.34

LLONTOP, P. D.; TORRES, C. E.; PALOMINO TOFFLINGER, J.; GRIESELER, R.; GUERRA, J. A.(2018). Luminescence of sputtered Tb3+ doped ITO thin films and its impact on the host¿s optical and electrical properties. En Latin America Optics and Photonics Conference 2018. OSA Publishing. Recuperado de: https://www.osapublishing.org/abstract.cfm?uri=LAOP-2018-Tu2A.3

Preissler, N.; Daniel, A.; DULANTO, J. A.; PALOMINO TOFFLINGER, J.; Trinh, C. T.; Trahms, M.; Abou-Ras, D.; Kirmse, H.; WEINGÄRTNER, R.; Rech, B.; Schlatmann, R.(2018). Passivation of Liquid-Phase Crystallized Silicon With PECVD-SiNx and PECVD-SiNx/SiOx. Physica Status Solidi (A) Applications and Materials Science. Volumen: 215. Recuperado de: https://onlinelibrary.wiley.com/doi/abs/10.1002/pssa.201800239

MONTAÑEZ, L. M.; PALOMINO TOFFLINGER, J.; GRIESELER, R.; Fischer, P.; Ben-Or, A.; GUERRA, J. A.; WEINGÄRTNER, R.; Osten, H. J.; Kribus, A.(2018). Structural, optical, and interface properties of sputtered AlN thin films under different hydrogen dilution conditions. Materials Today: Proceedings. Volumen: 5. (pp. 14765 - 14771). Recuperado de: https://www.sciencedirect.com/science/article/pii/S2214785318306552?via%3Dihub

GUERRA, J. A.; Rech, B.; Korte, L.; Kegelmann, L.; PALOMINO TOFFLINGER, J.; Albrecht, S.; Rech, B.; Albrecht, S.(2017). Determination of the complex refractive index and optical bandgap of CH3NH3PbI3 thin films. Journal of applied physics. Volumen: 121. (pp. 173104). Recuperado de: https://aip.scitation.org/doi/figure/10.1063/1.4982894

Preissler, N.; PALOMINO TOFFLINGER, J.; Gabriel, O.; Sonntag, P.; Amkreutz, D.; Stannowski, B.; Rech, B.; Schlatmann, R.(2017). Passivation at the interface between liquid-phase crystallized silicon and silicon oxynitride in thin film solar cells. Progress in Photovoltaics: Research and Application. Volumen: 7. Recuperado de: http://onlinelibrary.wiley.com/doi/10.1002/pip.2852/abstract