GRIESELER, R.; Au, I. S.; Kups, T.; Schaaf, P.(2014).
Diffusion in thin bilayer films during rapid thermal annealing. physica status solidi (a). Volumen: 211. (pp. 2635 - 2644).
GRIESELER, R.; Klaus, J.; Stubenrauch, M.; Tonisch, K.; Michael, S.; Pezoldt, J.; Schaaf, P.(2012).
Residual stress measurements and mechanical properties of AlN thin films as ultra-sensitive materials for nanoelectromechanical systems. Philosophical magazine. Volumen: 92. (pp. 3392 - 3401).