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ROLF GRIESELER

ROLF GRIESELER

ROLF GRIESELER

Doktor-Ingenieur, TECHNISCHE UNIVERSITAET ILMENAU

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Diplom-Ingenieur (TECHNISCHE UNIVERSITAET ILMENAU)

DOCENTE CONTRATADO - CONTRATADO
Docente a tiempo completo (DTC)
Departamento Académico de Ciencias - Sección Física

Publicaciones

Se encontraron 47 publicaciones

GRIESELER, R.; Theska, F.; Stürzel, T.; Hähnlein, B.; Stubenrauch, M.; Hopfeld, M.; Kups, T.; Pezoldt, J.; Schaaf, P.(2016). Elastic properties of nanolaminar Cr2AlC films and beams determined by in-situ scanning electron microscope bending tests. Thin Solid Films. Volumen: 604. (pp. 85 - 89). Recuperado de: http://linkinghub.elsevier.com/retrieve/pii/S004060901600198X
GRIESELER, R.; CAMARGO, M. K.; Hopfeld, M.; DIAZ, M. I.; Bund, A.; Schaaf, P.(2016). MAX Phase Thin Films As Electrical-Conductive Corrosion-Protective Coatings with Self-Healing Abilities. En Pacific RIM Meeting on Electrochemical and Solid State Sciences. The Electrochemical Society. Recuperado de: https://ecs.confex.com/ecs/230/meetingapp.cgi/Paper/93759
Pjevic, D.; Obradovic, M.; Marinkovic, T.; Grce, A.; Milosavljevic, M.; GRIESELER, R.; Kups, T.; Wilke, M.; Schaaf, P.(2015). Properties of sputtered TiO2 thin films as a function of deposition and annealing parameters. Physica B: Condensed Matter. Volumen: 463. (pp. 20 - 25). Recuperado de: http://linkinghub.elsevier.com/retrieve/pii/S0921452615000708
GRIESELER, R.; CAMARGO, M. K.; Hopfeld, M.; Bund, A.; Schaaf, P.(2014). Copper-Nanolaminate Composites: a New and Promising Material for Electrical Contacts in High Voltage and High Current Applications. En 226th Meeting of The Electrochemical Society (ECS) and XXIX Congreso de la Sociedad Electroquímica de Alemania (SMEQ) Joint International Meeting . IOP Science.
GRIESELER, R.; Au, I. S.; Kups, T.; Schaaf, P.(2014). Diffusion in thin bilayer films during rapid thermal annealing. physica status solidi (a). Volumen: 211. (pp. 2635 - 2644).
Hopfeld, M.; GRIESELER, R.; Vogel, A.; Romanus, H.; Schaaf, P.(2014). Tribological behavior of selected Mn+1AXn phase thin films on silicon substrates. Surface & coatings technology. Volumen: 257. (pp. 286 - 294). Recuperado de: http://www.sciencedirect.com/science/article/pii/S0257897214007440
GRIESELER, R.; Klaus, J.; Stubenrauch, M.; Tonisch, K.; Michael, S.; Pezoldt, J.; Schaaf, P.(2012). Residual stress measurements and mechanical properties of AlN thin films as ultra-sensitive materials for nanoelectromechanical systems. Philosophical magazine. Volumen: 92. (pp. 3392 - 3401).