Búsqueda avanzada

PAUL ANTONIO RODRIGUEZ VALDERRAMA

PAUL ANTONIO RODRIGUEZ VALDERRAMA

PAUL ANTONIO RODRIGUEZ VALDERRAMA

Doctor of Philosophy, UNIVERSITY OF NEW MEXICO

Ver todos los grados

Master of Science Electrical Engineering (UNIVERSITY OF NEW MEXICO)

Ingeniero Electrónico
DOCENTE ORDINARIO - PRINCIPAL
Tiempo parcial por asignaturas (TPA)
Departamento Académico de Ingeniería - Sección Electricidad y Electrónica

Publicaciones

Se encontraron 102 publicaciones

RODRIGUEZ, P. A.(2013). Total Variation Regularization Algorithms for Images Corrupted with Different Noise Models: A Review. Journal of Electrical and Computer Engineering. Volumen: 2013. (pp. 1 - 18). Recuperado de: http://dx.doi.org/10.1155/2013/217021
RODRIGUEZ, P. A.(2011). Total Variation Regularization for Poisson Vector-Valued Image Restoration with a Spatially Adaptive Regularization Parameter Selection. En IEEE Symposium on Image and Signal Processing and Analysis (ISPA). (pp. 402 - 407). DOBROVNIK. IEEE.
RODRIGUEZ, P. A. y Wohlberg, B.(2015). Translational and rotational jitter invariant incremental principal component pursuit for video background modeling. En Image Processing (ICIP), 2015 IEEE International Conference on . (pp. 537 - 541). IEEE. Recuperado de: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7350856
Bourgeois, P.; RODRIGUEZ, P. A.; Ragot, N.(2011). Unwrapping Catadioptric Images via Total Variation Regularization. En IEEE International Symposium on Robotic and Sensors Environments (ROSE). (pp. 220 - 225). MONTREAL. IEEE. Recuperado de: http://sites.google.com/a/istec.net/prodrig/Home/pubs
RODRIGUEZ, P. A. y Wohlberg, B.(2014). Video Background Modeling under Impulse Noise. En IEEE International Conference on Image Processing. (pp. 1041 - 1045). IEEE. Recuperado de: http://dx.doi.org/10.1109/ICIP.2014.7025207
Chau, G.; Li, Y.; Jakovljevic, M.; Dahl, J.; RODRIGUEZ, P. A.(2018). Wall Clutter Removal in Doppler Ultrasound using Principal Component Pursuit. En IEEE International Ultrasonics Symposium. (pp. 1 - 4). IEEE. Recuperado de: https://doi.org/10.1109/ULTSYM.2018.8579699