JAN AMARU PALOMINO TOFFLINGER

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Artículos en memoria o anales de congreso (6)Artículos en revista (60)Tesis (1)

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Se encontraron 67 publicaciones

Preissler, N.; Daniel, A.; DULANTO, J. A.; PALOMINO TOFFLINGER, J.; Trinh, C. T.; Trahms, M.; Abou-Ras, D.; Kirmse, H.; WEINGÄRTNER, R.; Rech, B.; Schlatmann, R.(2018). Passivation of Liquid-Phase Crystallized Silicon With PECVD-SiNx and PECVD-SiNx/SiOx. Physica Status Solidi (A) Applications and Materials Science. Volumen: 215. Recuperado de: https://onlinelibrary.wiley.com/doi/abs/10.1002/pssa.201800239

MONTAÑEZ, L. M.; PALOMINO TOFFLINGER, J.; GRIESELER, R.; Fischer, P.; Ben-Or, A.; GUERRA, J. A.; WEINGÄRTNER, R.; Osten, H. J.; Kribus, A.(2018). Structural, optical, and interface properties of sputtered AlN thin films under different hydrogen dilution conditions. Materials Today: Proceedings. Volumen: 5. (pp. 14765 - 14771). Recuperado de: https://www.sciencedirect.com/science/article/pii/S2214785318306552?via%3Dihub

GUERRA, J. A.; Rech, B.; Korte, L.; Kegelmann, L.; PALOMINO TOFFLINGER, J.; Albrecht, S.; Rech, B.; Albrecht, S.(2017). Determination of the complex refractive index and optical bandgap of CH3NH3PbI3 thin films. Journal of applied physics. Volumen: 121. (pp. 173104). Recuperado de: https://aip.scitation.org/doi/figure/10.1063/1.4982894

Preissler, N.; PALOMINO TOFFLINGER, J.; Gabriel, O.; Sonntag, P.; Amkreutz, D.; Stannowski, B.; Rech, B.; Schlatmann, R.(2017). Passivation at the interface between liquid-phase crystallized silicon and silicon oxynitride in thin film solar cells. Progress in Photovoltaics: Research and Application. Volumen: 7. Recuperado de: http://onlinelibrary.wiley.com/doi/10.1002/pip.2852/abstract

TUCTO, K. Y.; FLORES, L. F.; GUERRA, J. A.; PALOMINO TOFFLINGER, J.; DULANTO, J. A.; GRIESELER, R.; Osvet, A.; Batentschuk, M.; WEINGÄRTNER, R.(2017). Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells. MRS Advances. Volumen: 2. (pp. 2989 - 2995). Recuperado de: https://www.cambridge.org/core/journals/mrs-advances/article/production-and-characterization-of-tb3yb3-coactivated-alon-thin-films-for-down-conversion

GUERRA, J. A.; ANGULO, J. R.; GOMEZ, S. M.; LLAMOZA, J. A.; MONTAÑEZ, L. M.; TEJADA, A.; PALOMINO TOFFLINGER, J.; Winnacker, A.; WEINGÄRTNER, R.(2016). The Urbach focus and optical properties of amorphous hydrogenated SiC thin films. Journal of Physics D: Applied Physics. Volumen: 49. Recuperado de: http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=1&SID=4CG8cHbQv6Eq8riJ6Qj&page=1&doc=1

Preissler, N.; PALOMINO TOFFLINGER, J.; Shutsko, I.; Gabriel, O.; Calnan, S.; Stannowski, B.; Rech, B.; Schlatmann, R.(2016). Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance-voltage measurements. Physica Status Solidi (A) Applications and Materials Science. Volumen: 213. (pp. 1697 - 1704). Recuperado de: http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532957/abstract

GUERRA, J. A.; MONTAÑEZ, L. M.; TUCTO, K. Y.; ANGULO, J. R.; PALOMINO TOFFLINGER, J.; Winnaker, A.; WEINGÄRTNER, R.(2016). Bandgap Engineering of Amorphous Hydrogenated Silicon Carbide. MRS Advances. Volumen: 1. (pp. 2929 - 2934). Recuperado de: https://www.cambridge.org/core/journals/mrs-advances/article/bandgap-engineering-of-amorphous-hydrogenated-silicon-carbide/37D9BA072EC02E3825C436D35D6