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FRANCISCO ANTONIO DE ZELA MARTINEZ

FRANCISCO ANTONIO DE ZELA MARTINEZ

FRANCISCO ANTONIO DE ZELA MARTINEZ

Doctor en Física, PONTIFICIA UNIVERSIDAD CATOLICA DEL PERU

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Magíster en Física (UNIVERSIDAD DE BONN)

Licenciado en Física
DOCENTE ORDINARIO - PRINCIPAL
Docente a tiempo completo (DTC)
Departamento Académico de Ciencias - Sección Física

Publicaciones

Se encontraron 112 publicaciones

DE ZELA, F. A.(2011). The Pancharatnam-Berry phase: theoretical and experimental aspects. En Quantum Mechanics. (pp. 289 - 312). InTech.
Weingärtner, R.; Guerra, J. A.; Erlenbach, O.; Gálvez, G.; DE ZELA, F. A.; Winnacker, A.(2010). Bandgap engineering of the amorphous wide bandgap semiconductor (SiC)1-x (AlN)x doped with terbium and its optical emission properties. Materials Science and Engineering B: Solid-State Materials for Advanced Technology. Volumen: 174. (pp. 114 - 118).
WEINGÄRTNER, R.; GUERRA, J. A.; Erlenbach, O.; GÁLVEZ, G. A. F.; DE ZELA, F. A.; Winnacker, A.(2010). Bandgap engineering of the amorphous wide bandgap semiconductor (SiC)1-x(AlN)x doped with terbium and its optical emission properties. Materials science and engineering. Volumen: 174. (pp. 114 - 118). Recuperado de: http://
DE ZELA, F. A.(2010). Comment on Contextuality within quantum mechanics manifested in subensemble mean values. Physics Letters, Section A: General, Atomic and Solid State Physics. Volumen: 374. (pp. 1397 - 1400).
Guerra, J. A.; Winterstein, A.; Erlenbach, O.; Gálvez, G.; DE ZELA, F. A.; Weingärtner, R.; Winnacker, A.(2010). Determination of the optical bandgap of thin amorphous (SiC) 1-x(AlN)x films. En 13th International Conference on Silicon Carbide and Related Materials 2009, ICSCRM 2009. (pp. 263 - 266). Materials Science Forum.
GÁLVEZ, G. A. F.; GUERRA, J. A.; Erlenbach, O.; Steidl, M.; WEINGÄRTNER, R.; DE ZELA, F. A.; Winnacker, A.(2010). Determination of the sputter rate variation pattern of a silicon carbide target for radio frequency magnetron sputtering using optical transmission measurements. Materials Science and Engineering: B. Volumen: 174. (pp. 127 - 131). Recuperado de: http://dx.doi.org/10.1016/j.mseb.2010.03.012
Gálvez, G.; Guerra, J. A.; Erlenbach, O.; Steidl, M.; Weingärtner, R.; DE ZELA, F. A.; Winnacker, A.(2010). Determination of the sputter rate variation pattern of a silicon carbide target for radio frequency magnetron sputtering using optical transmission measurements. En Solid-State Materials for Advanced Technology. (pp. 127 - 131). Materials Science and Engineering B.
Gálvez de la Puente, G.; Erlenbach, O.; Guerra Torres, J. A.; Hupfer, T.; Steidl, M.; DE ZELA, F. A.; Weingärtner, R.; Winnacker, A.(2010). Quality control and electrical properties of thin amorphous (SiC) 1-x(AlN)x films produced by radio frequency dual magnetron sputtering. En 13th International Conference on Silicon Carbide and Related Materials 2009, ICSCRM 2009. (pp. 1199 - 1202). Materials Science Forum.