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WALTER ENRIQUE CALIENES BARTRA

WALTER ENRIQUE CALIENES BARTRA

WALTER ENRIQUE CALIENES BARTRA

Doctor en Microelectrónica, UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL

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Maestría en Microelectrónica (UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL)

Ingeniero Electrónico
DOCENTE CONTRATADO - CONTRATADO
Tiempo parcial por asignaturas (TPA)
Departamento Académico de Ingeniería - Sección Electricidad y Electrónica

Publicaciones

Se encontraron 11 publicaciones

Marquez, C.; Brendler, L.; Wrobel, F. (Compilador); Zimpeck, A. (Editor); CALIENES, W. E. (Editor); Butzen, P. (Editor); Meinhardt, C. (Editor). (2023). A Detailed Electrical Analysis of SEE on 28nm FDSOI SRAM Architectures. En 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI). IEEE. Recuperado de: https://doi.org/10.1109/SBCCI60457.2023.10261665
CALIENES, W. E.(2017). Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.. MICROELECTRONICS RELIABILITY. Volumen: 76-77. (pp. 655 - 659).
CALIENES, W. E.(2017). MRAM Control Transistor Resilience Against Heavy-Ion Impacts. En 10th IEEE International Caribbean Conference on Devices, Circuits And Systems ICCDCS 2017. IEEE.
CALIENES, W. E.(2017). Process and Temperature Impact on Single-Event Transients in 28nm FDSOI CMOS.. En 8th IEEE Latin American Symposium on Circuits and Systems LASCAS 2017. IEEE.
CALIENES, W. E.(2016). FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects.. MICROELECTRONICS RELIABILITY. (pp. 152 - 157).
CALIENES, W. E.(2016). Simulation of Single-Event Effects on Fully Depleted Silicon On- Insulator (FDSOI) CMOS. En Semiconductor Devices in Harsh Conditions. (pp. 43 - 68). CRC Press.
CALIENES, W. E.(2015). Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients. En 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS). EL CAIRO. IEEE.
CALIENES, W. E.(2015). Estudo e Implementação do Algoritmo Simulated Annealing para Posicionamento de Células utilizando LabVIEW. En Iberchip 2015. IBERCHIP.