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WALTER ENRIQUE CALIENES BARTRA

WALTER ENRIQUE CALIENES BARTRA

WALTER ENRIQUE CALIENES BARTRA

Doctor en Microelectrónica, UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL

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Maestría en Microelectrónica (UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL)

Ingeniero Electrónico
DOCENTE CONTRATADO - CONTRATADO
Tiempo parcial por asignaturas (TPA)
Departamento Académico de Ingeniería - Sección Electricidad y Electrónica

Publicaciones

Se encontraron 11 publicaciones

Marquez, C.; Brendler, L.; Wrobel, F. (Compilador); Zimpeck, A. (Editor); CALIENES, W. E. (Editor); Butzen, P. (Editor); Meinhardt, C. (Editor). (2023). A Detailed Electrical Analysis of SEE on 28nm FDSOI SRAM Architectures. En 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI). IEEE. Recuperado de: https://doi.org/10.1109/SBCCI60457.2023.10261665
CALIENES, W. E.(2014). Bulk and FDSOI SRAM Resiliency to Radiation Effects. En IEEE 57th International Midwest Symposium of Circuits and Systems. IEEE.
CALIENES, W. E.(2015). Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients. En 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS). EL CAIRO. IEEE.
CALIENES, W. E.(2015). Estudo e Implementação do Algoritmo Simulated Annealing para Posicionamento de Células utilizando LabVIEW. En Iberchip 2015. IBERCHIP.
CALIENES, W. E.(2017). Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.. MICROELECTRONICS RELIABILITY. Volumen: 76-77. (pp. 655 - 659).
CALIENES, W. E.(2016). FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects.. MICROELECTRONICS RELIABILITY. (pp. 152 - 157).
CALIENES, W. E.(2014). Impact of SEU on Bulk and FDSOI CMOS RAM. En 10th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. EuroSIO.
CALIENES, W. E.(2015). Modeling the impact of Heavy Ion on FDSOI NanoCMOS. En IEEE 6th Latin American Symposium on Circuits & Systems. IEEE.